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The manufacturer/developer QWED, refers to the compatibility of the SPDR with Keysight / Agilent Technologies Network Analyzers and with Resonant Cavity Software as detailed in:
Technical Brief: Material Measurement Software Keysight N1500A. The abstract is available: http://literature.cdn.keysight.com/litweb/pdf/5989-5384EN.pdf?id=838432
The lecture written by the expert prof. of QWED. Jerzy Krupka available in PDF version: http://www.qwed.eu/IMS2004_JK_Substrates.pdf
Note: Prices quoted include resonators and software that converts the results direct results of the Q factor and frequency measurements on the complex permittivity of the measured samples. There are several ways to apply the software.
Upload the measurement results from any Network Analyzer to a PC and run the QWED software on the PC to get the complex permittivity results.
Users who have Keysight N1500A software with option 003 / Agilent 85071E with option 300, you can add the QWED libraries to the Keysight / Agilent software. Results will be displayed directly on the Network Analyzer screen
Use the MMS suite to eliminate manual data transfer from VNA to PC: results will be displayed on the PC screen.
It is also It is possible to use Q-Meter, a low-cost QWED portable device, used to perform Network Analyzer functions.
The standard operating procedure is available in the Zenodo open access repository: https://zenodo.org/record/2673793 #.XULptvIzZ0y
SPDR conforming to IEC 61189-2-721 standard (Edition 1. 2015-04)
Application: SPDRs are intended to measure the complex permittivity of sheet dielectric materials, including LTCC substrates, but also ferroelectric thin films deposited on low-loss dielectric substrates. In addition, SPDRs can be used to measure the surface resistance and conductivity of various conductive materials, such as commercial resistive layers, conductive polymer thin films, or high-resistivity semiconductors. Such measurements are only possible for samples with high surface resistance with Rs > 5 kΩ/square.
Accuracy of measurements of a sample of thickness h:
Δε/ε=±(0.0015 + Δh/h)
Δtanδ= ±2*10-5 or ±0.03*tanδ, whichever is greater
Operating frequency range: SPDR uses a particular resonant mode. This mode has a particular resonant frequency that depends on the dimensions of the resonator but also, to some extent, on the electrical properties of the sample being measured. Thus, each resonator is designed for a particular nominal frequency and the actual measurement is taken at a frequency close to nominal. SPDR baseline nominal frequencies are: 1.1 GHz, 2.45 GHz, 5 GHz, 10 GHz, and 15 GHz. Resonators for the other frequencies in the 1.1 to 15 GHz range can be manufactured under special order.
Operating temperature range: -270C to +110C
Additional equipment needed to perform measurement: Microwave Q-Meter or Vector Network Analyzer
Measurement procedure: Resonance frequency and Q factor are measured of the empty resonator and of the resonator with investigated sample. Dedicated software is provided for the determination of dielectric loss tangent and permittivity. Users who have access to one of Agilent Technologies' PNA/ENA series network analyzers equipped with 85071E Material Measurement Software with Option 300 simply load the dedicated QWED application on the network analyzer and get the results. finals directly on your screen. Users working with different network analyzers should install the dielectric properties calculation software on a standard PC computer or network analyzer if equipped with the Windows® operating system.
Additional information: The minimum size of a sample depends on the operating frequency of the resonator. The minimum sample sizes for the most popular resonator operating frequencies are:
Nominal frequency [GHz]: 1.1
Minimum sizes/diameter of sample (dmin) [mm]: 120x120 / 120
Maximum width of sample (dmax) [mm]*^: 165
Recommended sizes of sample (drec) [mm]**: 165
Maximum thickness of sample [mm]: 6.0
Nominal frequency [GHz]: 2.45 / 2.5
Minimum sizes/diameter of sample (dmin) [mm]: 55x55 / 55
Maximum width of sample (dmax) [mm]*^: 100
Recommended sizes of sample (drec) [mm]**: 85
Maximum thickness of sample [mm]: 3.1
Nominal frequency [GHz]: 5 / 5.1
Minimum sizes/diameter of sample (dmin) [mm]: 30x30 / 30
Maximum width of sample (dmax) [mm]*^: 90
Recommended sizes of sample (drec) [mm]**: 65
Maximum thickness of sample [mm]: 1.95
Nominal frequency [GHz]: 10
Minimum sizes/diameter of sample (dmin) [mm]: 22x22 / 22
Maximum width of sample (dmax) [mm]*^: 90
Recommended sizes of sample (drec) [mm]**: 45
Maximum thickness of sample [mm]: 0.95
Nominal frequency [GHz]: 15
Minimum sizes/diameter of sample (dmin) [mm]: 14x14 / 14
Maximum width of sample (dmax) [mm]*^: 40
Recommended sizes of sample (drec) [mm]**: 35
Maximum thickness of sample [mm]: 0.6
* Limitation for diameter of circular samples. For rectangular samples, limitation relates only to one sample dimension (the other dimension may be larger).
** For easy sample handling, diameter d of circular sample is recommended to be drec ^ For non-standard sample sizes contact QWED team.
