El DSO-LCR500 combines the advantages of a digital oscilloscope and a multifunctional component tester in a compact and high-quality case. With the help of the digital oscilloscope, ambitious tinkerers can evaluate time-dependent signals without having to resort to expensive measurement technology.
The multifunctional component tester also allows fast and automatic detection of components. Furthermore, the DSO-LCR500 has additional helpful functions such as a signal generator, an infrared signal decoder and measurement of Zener diodes, DS18B20 sensors and DHT11 sensors.
The device is equipped with a 1500 mAh rechargeable battery, which can be conveniently charged via USB-C. The integrated, fold-out stand additionally eases the operation.
Features:
Digital oscilloscope,
Component tester,
Continuity tester,
Signal generator,
Measurement of zener diodes,
measurement of DS18B20 sensors,
Measurements of DHT11 sensors,
Infrared decoder
Items shipped: JT-DSO-LCR500, user guide, USB-C cable, 3 x test clip, 3 x SMD test probes, probe, cocodrile clip cable, BNC adapter
Power supply:
1500 mAh lithium battery, rechargeable via USB-C
Oscilloscope:
Bandwith: 500KHz
Vertical sensivity: 10 mV/Div - 10 V/Div
Display: 2,4“ TFT color display, LED-backlight, 320x240 pixel
Sampling rate: 10 MS/s
Input resistance: 1 MΩ
Coupling: AC / DC
Test voltage range: 1:1 80 Vpp (-40V-40V) - 10:1: 800Vpp (-400V - 400V)
Horizontal time base: 10 μs - 10s
Trigger modes: Automatic, normal, single
Trigger types: Falling edge, rising edge
Signal Generator:
Sine wave: 1 - 100 kHz, 0 - 3,3 V, 50%
Square wave: 1 - 100 kHz, 3,3 V, 50%
Pulse wave: 1 - 100 kHz, 3,3 V, 0 - 100%
Triangle wave: 1 - 100 kHz, 0 - 3,3 V, 50%
Ramp wave: 1 - 100 kHz, 0 - 3,3 V, 0 - 100%
DC signal: 0 - 3,3 V
Multifunction tester:
Transistor measurements (HFE z10, HFE < 600): Amplification (hFE), base-emitter-voltage (Ube), collector-emitter reverse cut-off current (Iceo, Ices), protection diode forward, voltage drop (Uf)
Diode measurements (forward voltage drop < 5 V): Forward voltage drop, junction capacitance, reverse leakage current
Zener diode measurements (1-2-3 testing range: 0,01 - 4,5V. K-A-A testing range: 0,01-24 V): 1-2-3: Forward voltage drop, reverse breakdown voltage, K-A-A: reverse breakdown voltage
Field effect transistor measurements (JFET, IGBT, MOSFET): JFET: Gate capacitance(Cg), drain current (Id at Vgs), protection diode forward voltage drop (Uf) IGBT: drain current (Id at Vgs), protection diode forward voltage drop (Uf) MOSFET: turn-on voltage (Vt), gate capacitance (Cg), drain-source resistance (Rds), protection diode forward voltage drop (Uf)
SCR & TRIAC measurements (turn on voltage < 5 V, gate trigger current < 5 mA): gate voltage
Capacitor measurements (25 pF - 100 mF): Capacity, loss factor (Vloss)
Resistor measurements (10 μH - 1000 μH): Inductance value, DC resistance
Battery measurements ( 0,01 - 4,5 V: Voltage value
DS18B20 Measurements: Temperature
DHT11 Measurements: Temperature and humidity
Infrared decoding (NEC protocoll): Display user & data code, display infrared waveform
Continuity: continuity test, voltages up to 40V